SSBII1

Chemical Force Microscopy : the Use of Modified AFM Tips to Probe Specific Chemical Forces at Surfaces

D.A. Smith University of Leeds

The significant impact of atomic force microscopy in the 90's has undoubtedly principally resulted from its potential to produce high-resolution images of a variety of materials under ambient and liquid environments. Applications have resulted ranging from electrochemistry to biology and from the academics bench to the semiconductor manufacturer production line. Whilst I will highlight the potential impact of such data, it is clear that much of the future growth in force microscopy will come from the combination of such images with similarly resolved information on a surface's physical and chemical properties. I will introduce through relevant examples the variety of means in which the acquisition modes utilised in atomic force microscopy can be manipulated to reveal surface properties such as viscoelasticity, adhesion, tribology, biocompatibility and hydrophobicity. In particular the complimentarily of such data will be demonstrated. The key role of understanding and controlling the surface chemistry of the force microscope probe will be highlighted.